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Desktop Diffraction Instrument High Quality Benchtop XRD Diffractometer Machine

    Buy cheap Desktop Diffraction Instrument High Quality Benchtop XRD Diffractometer Machine from wholesalers
     
    Buy cheap Desktop Diffraction Instrument High Quality Benchtop XRD Diffractometer Machine from wholesalers
    • Buy cheap Desktop Diffraction Instrument High Quality Benchtop XRD Diffractometer Machine from wholesalers

    Desktop Diffraction Instrument High Quality Benchtop XRD Diffractometer Machine

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    Brand Name : Lonroy
    Model Number : LR-D270
    Certification : ISO ASTM CE
    Price : Negotaible
    Payment Terms : L/C,D/A,D/P,T/T,Western Union
    Supply Ability : 200
    Delivery Time : 5-8 work days
    • Product Details
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    Desktop Diffraction Instrument High Quality Benchtop XRD Diffractometer Machine

    Desktop Diffraction Instrument High Quality Benchtop XRD Diffractometer Machine

    1.Product Introduction

    Designed for industrial production and quality control, advanced technology for the production of concentrated X-ray diffractometers, functional and miniaturized benchtop X-ray diffractometers. It can precisely conduct qualitative analysis, quantitative analysis and crystal structure analysis on both metal and non-metal samples. It is especially suitable for the manufacturing industries of products such as catalysts, titanium dioxide, cement, and pharmaceuticals.


    2.Product Parameter

    Operating power

    600W(40kV, 15mA) or 1600W(40kV, 40mA), stability: < 0.005%

    X-ray tube

    Metal ceramic X-ray tube, Cu target, power 2.4KW, focus size: 1×10mm, air-cooled or water-cooled (water flow rate greater than 2.5L/min)

    Goniometer

    Sample level Optical coding technology and servo motors are adopted to drive the rotation of θs and θd

    Measurement method

    Continuous, step-by-step, Omg

    Angle measurement range

    - 3 °- 150 °

    Minimum step width

    0.0001 °

    Angle reproduction

    0.0005 °

    Angular positioning speed

    1500°/min

    Detector

    Digital pulse processing counting or semiconductor array detector

    Counting throughput

    1×107CPS, 9×107CPS

    Energy spectrum resolution

    25% or 1keV

    Computer

    Business notebook

    Instrument control software

    Windows10 operating system, automatically controls the tube voltage, tube current, photoswitch and X-ray tube aging training of the X-ray generator. Control the goniometer to scan continuously or step by step, and simultaneously collect diffraction data. Conventional processing of diffraction data: automatic peak finding, manual bee finding, integration intensity, peak height, center of gravity, background subtraction, smoothing, peak shape magnification, spectrum comparison, etc.

    Data processing software

    Phase qualitative analysis, fixed-position analysis, Kα1, α2 exfoliation, full spectrum fitting, peak selection fitting, half-height width and grain size calculation, unit cell determination, Class II stress calculation, diffraction line indexing, multiple plotting, 3D plotting, diffraction data calibration, background subtraction, quantitative analysis without calibration, full spectrum fitting (WPF), XRD diffraction spectrum simulation and other functions.

    Scattered line protection

    Lead + lead-glass protection, the light gate window is connected to the protective device, and the scattering line is calculated not more than 1μSv/h

    Comprehensive stability of the instrument

    0.5%

    One-time softening data of the sample

    Configure the sample changer, with a maximum of 6 samples loaded each time

    Instrument external dimensions

    580×450×680(L×W×H)mm


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